A University of Maryland professor has a radical approach to the problem of nanometer IC variability: Put it off. By combining design optimizations with postsilicon fixes, IC yield loss can be avoided ...
Synopsys, Inc. (Nasdaq: SNPS) today announced the availability of its PrimeYield ™ solution, a breakthrough for pre-silicon design yield analysis enabled by patented fast statistical methods and ...
At this week's Design Automation Conference, Magma Design Automation will announce limited availability of its Blast Yield technology, which features statistical timing analysis and ...
Manual and automated IC-layout tools are integrated in the PEYE Yield Finder analysis software. The combined yield-driven, standard-cell, design optimization flow facilitates the application of design ...
There is no single solution, but there plenty of room for improvement—and lots of investment around better use of data. Equipment and tools vendors are starting to focus on data as a means of ...
To ensure success in semiconductor technology development, process engineers must set the allowed ranges for wafer process parameters. Variability must be controlled, so that final fabricated devices ...
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