EDN

Take scan test out of the critical path

Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...
Electronic Design

Learn ABCs Of JTAG Boundary-Scan Testing With Software Bundle

Boundry-scan testing (IEEE1149.1/JTAG) is a novel procedure for some test engineers and technicians. But ScanWorks Interconnect Development Station version 3.4 from Asset Intertech should ease their ...
No Jitter

Are Open Source Active Path Testing Tools Viable for You?

I use the term “active path testing” to refer to systems that send packets into the network to measure network characteristics. A simple ping test is the most fundamental active path test, but it ...
Electronic Design

Reduce Test/Diagnosis Cost with Optimized Scan-Pattern Ordering

Download this article in PDF format. Finding the right balance among test cost, test quality, and data collection for running diagnosis requires consideration of several competing factors. Luckily ...