A recent review article published in Advanced Materials explored the potential of artificial intelligence (AI) and machine learning (ML) in transforming thermoelectric (TE) materials design. The ...

Catching all defects in chip packaging is becoming more difficult, requiring a mix of electrical tests, metrology screening, and various types of inspection. And the more critical the application for ...

image: THE INTRODUCTION OF DEFECTS INTO ELECTRODE MATERIALS FOR METAL-BASED BATTERIES IS AN EFFECTIVE STRATEGY TO IMPROVE BATTERY PERFORMANCE, DUE TO DEFECTIVE CATALYSTS HAVE THE ADVANTAGES OF HIGH ...

A technical paper titled “Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy” was published by researchers at ...

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...

An international research team led by NYU Tandon School of Engineering and KAIST (Korea Advanced Institute of Science and Technology) has pioneered a new technique to identify and characterize ...

CNC machining benefits, precision engineering, advanced fabrication techniques, tight tolerance manufacturing, custom ...

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

(Nanowerk Spotlight) The field of drug delivery has long been challenged by the need for precise, targeted methods to transport therapeutic agents within the body. Traditional approaches often ...

Defect states refer to electronic energy levels that arise from imperfections or irregularities in the crystal structure of materials, particularly in semiconductors and insulators. These ...